Mobile phones for the assessment of burns: we have the technology

K Shokrollahi, M Sayed, W Dickson… - Emergency Medicine …, 2007 - emj.bmj.com
Objective: To investigate the accuracy of assessment of burn surface area and depth using a
basic camera-equipped mobile phone. Methods: 31 patients with minor burns were …

Statistical approach to analyze duty cycle jitter amplification in NAND flash memory system

S Mobin, C Cui, F Rao - 2018 IEEE 27th Conference on …, 2018 - ieeexplore.ieee.org
Jitter is amplified in any lossy system due to the channel loss. The amplification occurs at
any jitter frequency below Nyquist. Jitter amplification grows exponentially with jitter …

Impact of read enable (RE) signal duty cycle distortion (DCD) in NAND flash SI simulation

S Mobin, B Raghunathan, A Katz - 2017 IEEE 26th Conference …, 2017 - ieeexplore.ieee.org
Impact of Read Enable (RE) signal's Duty Cycle Distortion (DCD) must be integrated in
NAND to Flash Management Controller (FMC) SI simulation to predict system level …

Understanding NAND AC Timing Parameters and How to Accurately Implement them in SI Simulations

S Mobin, P Balachander - 2019 IEEE 23rd Workshop on Signal …, 2019 - ieeexplore.ieee.org
The Power Delivery Network (PDN) of the NAND Flash silicon characterization environment
contributes significant jitter in NAND clock signals (DQS/BDQS) duty cycles. The …

Distributed PDN Modeling Approach for Accurate Jitter Estimation in High-Speed NAND Flash Memory

S Mobin, P Balachander, A Sharma… - 2022 IEEE 31st …, 2022 - ieeexplore.ieee.org
Due to aggressive storage capacity demands, multiple NAND Flash die are often stacked in
a highly integrated, complex package system. As data-rate increases, bit time (UI) is …

[PDF][PDF] Some new sequence spaces defined by Musielak-Orlicz functions on a real n-normed space

T Jalal, MA Sayed - Gen, 2015 - researchgate.net
Some New Sequence Spaces Defined by Musielak-Orlicz Functions on a Real n- Normed
Space Page 1 Gen. Math. Notes, Vol. 27, No. 2, April 2015, pp. 47-58 ISSN 2219-7184; …

EMI modeling and correlation in a highly integrated package design

S Mobin, G Kumar, DN de Araujo… - 2016 IEEE 25th …, 2016 - ieeexplore.ieee.org
Electromagnetic emission must be properly addressed in complex multi-chip packages
(MCM) due to highly miniaturized form-factor requirements. Such modules induce electric …